@InProceedings{GalvãoVPMGCDM:2016:GrEpGr,
author = "Galv{\~a}o, Nierlly K. A. M. and Vasconcelos, Get{\'u}lio and
Pessoa, Rodrigo S{\'a}vio and Machado, Jo{\~a}o Paulo Barros and
Guerino, Marciel and Camus, Julien and Djouadi, Mohamed Abdou and
Maciel, H. S.",
affiliation = "{Instituto Tecnol{\'o}gico de Aeron{\'a}utica (ITA)} and
{Instituto de Estudos Avan{\c{c}}ados (IEAv)} and {Instituto
Tecnol{\'o}gico de Aeron{\'a}utica (ITA)} and {Instituto
Nacional de Pesquisas Espaciais (INPE)} and {Instituto
Tecnol{\'o}gico de Aeron{\'a}utica (ITA)} and {Institut des
Mat{\'e}riaux Jean Rouxel IMN} and {Institut des Mat{\'e}riaux
Jean Rouxel IMN} and {Instituto Tecnol{\'o}gico de
Aeron{\'a}utica (ITA)}",
title = "Grow of epitaxial graphene on SiC thin film using CO2 laser beam",
year = "2016",
organization = "International Conference on Advanced Nanomaterials, 7.",
abstract = "When SiC is heated under specific annealing conditions, the layers
of SiC crystals are decomposed. The Si sublimation occurs and the
remaining carbon atoms form the epitaxial graphene layer1 .
Usually this process takes place using induction furnaces at
vacuum or at atmospheric pressure with an inert gas flow. The
kinetics of formation, the structure and properties of graphene
are influenced by the process parameters and also by the
orientation and terminated face of the SiC wafer substrate1,2.
Recently, the use of CO2 laser as a source of heating in graphene
formation from single crystal of SiC and SiC particles have been
reported2,3 . The use of this technique is still new and technical
feasibility of grapheme formation using SiC thin films, to the
best of our knowledge, were not yet reported. In this work, the
viability of graphene growth by thermal decomposition of SiC thin
films using CO2 laser was investigated. The SiC thin films were
grown by plasma deposition technique using high-power impulse
magnetron sputtering (HiPMS). Unlike what happens with graphene
grown on single crystal SiC, the graphene was grown on the SiC
thin film with undefined (SiC) facetermination. The obtained films
were characterized thanks to chemical, structural and electrical
analysis using the mapping RAMAN, atomic force microscopy (AFM),
and 4 points probe, respectively.",
conference-location = "Aveiro, Portugal",
conference-year = "25-27 July",
language = "en",
urlaccessdate = "28 abr. 2024"
}